FULL PDF
Abstract
ebugging complex hardware simulation traces is a labor-intensive and error-prone process due to the intricate nature of digital circuit behavior and trace dependencies. In this paper, we propose a novel approach that leverages contrastive learning and attention mechanisms to automate the identification of fault-prone segments in simulation traces. Our methodology embeds trace segments into a learned vector space using a Siamese architecture, while attention layers prioritize signal relevance dynamically. Experimental results on benchmark circuits demonstrate up to 45% improvement in fault localization accuracy compared to traditional pattern-matching approaches. The proposed system paves the way for efficient trace analysis, reducing manual intervention and accelerating verification cycles
View more >>