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Research Article
July, 2017
CiiT International Journal of Programmable Device Circuits and Systems
A Novel Architecture for Test Pattern Generation in BIST
PREETHI D
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https://scholar9.com/publication-detail/a-novel-architecture-for-test-pattern-generation-i-13893
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PREETHI D "A Novel Architecture for Test Pattern Generation in BIST". CiiT International Journal of Programmable Device Circuits and Systems, Jul. 2017, https://scholar9.com/publication-detail/a-novel-architecture-for-test-pattern-generation-i-13893
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