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IEEE Transactions on Device and Materials Reliability (ITDMR)

Publisher :

IEEE Xplore

Scopus Profile
Peer reviewed only
Scopus Profile
Open Access
  • the devices
  • materials
  • processes

    • +4

e-ISSN :

1558-2574

Issue Frequency :

Quarterly

Impact Factor :

2.3

p-ISSN :

1530-4388

Est. Year :

2001

Mobile :

12124197900

DOI :

YES

Country :

United States

Language :

English

APC :

YES

Impact Factor Assignee :

GOOGLE SCHOLAR

Email :

isodiana.crupi@unipa.it

Journal Descriptions

IEEE Transactions on Device and Materials Reliability includes, but is not limited to Reliability of: Devices, Materials, Processes, Interfaces, Integrated Microsystems (including MEMS & Sensors), Transistors, Technology (CMOS, BiCMOS, etc.), Integrated Circuits (IC, SSI, MSI, LSI, ULSI, ELSI, etc.), Thin Film Transistor Applications. The measurement and understanding of the reliability of such entities at each phase, from the concept stage through research and development and into manufacturing scale-up, provides the overall database on the reliability of the devices, materials, processes, package and other necessities for the successful introduction of a product to market. This reliability database is the foundation for a quality product, which meets customer expectations. A product so developed has high reliability. High quality will be achieved because product weaknesses will have been found (root cause analysis) and designed out of the final product. This process of ever increasing reliability and quality will result in a superior product. In the end, reliability and quality are not one thing; but in a sense everything, which can be or has to be done to guarantee that the product successfully performs in the field under customer conditions. Our goal is to capture these advances. An additional objective is to focus cross fertilized communication in the state of the art of reliability of electronic materials and devices and provide fundamental understanding of basic phenomena that affect reliability. In addition, the publication is a forum for interdisciplinary studies on reliability. An overall goal is to provide leading edge/state of the art information, which is critically relevant to the creation of reliable products.


IEEE Transactions on Device and Materials Reliability (ITDMR) is :

International, Peer-Reviewed, Open Access, Refereed, the devices, materials, processes, package, Integrated Circuits, Transistors, Technology , Online or Print, Quarterly Journal

UGC Approved, ISSN Approved: P-ISSN - 1530-4388, E-ISSN - 1558-2574, Established in - 2001, Impact Factor - 2.3

Provide Crossref DOI

Indexed in Scopus, WoS

Not indexed in DOAJ, PubMed, UGC CARE

Indexing

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