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Research Article
August, 2017
Journal of VLSI Design and Signal Processing
A Modified Test Pattern Generation Architecture for Fault Detection in BIST
PREETHI D
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https://scholar9.com/publication-detail/a-modified-test-pattern-generation-architecture-fo-13895
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ISSN
2581-8449
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PREETHI D "A Modified Test Pattern Generation Architecture for Fault Detection in BIST". Journal of VLSI Design and Signal Processing, Aug. 2017, https://scholar9.com/publication-detail/a-modified-test-pattern-generation-architecture-fo-13895
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