Abstract
Multiple cell upsets (MCUs) are the major reliability issue of memories, when exposed to radiation. To prevent the occurrence of MCUs several error correction codes (ECCs) are used, but the main problem is that they require complex encoder and decoder architecture and higher delay overheads. The decimal matrix code (DMC) minimizes the area and delay overheads compared to the existing codes such as hamming, matrix codes, built in current sensor etc, and also improves the memory reliability by enhancing the error correction capability.
Authors
