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Journal Photo for X-Ray Optics and Instrumentation
Peer reviewed only Open Access

X-Ray Optics and Instrumentation (X-Ray OI)

Publisher : Hindawi
X-ray Optics Instrumentation and Measurement Science Applied Physics
e-ISSN 1687-7640
p-ISSN 1687-7632
Issue Frequency Continuously
Est. Year 2010
Mobile 4401243779777
Language English
APC YES
Email xroi@hindawi.com

Journal Descriptions

The X-Ray Optics and Instrumentation is a specialized open-access journal that focuses on the advancement of X-ray science and technology. Established in 2010, it provides a dedicated platform for researchers to publish innovative work related to X-ray optics, instrumentation, and experimental techniques. The journal covers a wide range of topics including X-ray imaging systems, diffraction methods, spectroscopy, detector technologies, and the design of optical components for X-ray applications. It emphasizes both theoretical and applied research, supporting developments in fields such as materials science, medical imaging, nanotechnology, and industrial inspection. The journal also highlights emerging technologies such as synchrotron radiation, free-electron lasers, and advanced imaging techniques. By promoting open access to scientific knowledge, the journal ensures that research findings are widely accessible to the global scientific community. It attracts contributions from physicists, engineers, and researchers working in interdisciplinary areas. The journal plays a significant role in advancing precision measurement, improving imaging capabilities, and supporting innovation in scientific instrumentation and analytical methods involving X-ray technologies.

X-Ray Optics and Instrumentation (X-Ray OI) is :-

  • International, Peer-Reviewed, Open Access, Refereed, X-ray Optics, Instrumentation and Measurement Science, Applied Physics, Imaging and Spectroscopy, Materials Science and Analytical Techniques, X-ray imaging systems, diffraction methods, spectroscopy, detector technologies, the design of optical components for X-ray applications, supporting developments in fields such as materials science, medical imaging, nanotechnology, industrial inspection , Online or Print , Continuously Journal

  • UGC Approved, ISSN Approved: P-ISSN P-ISSN: 1687-7632, E-ISSN: 1687-7640, Established: 2010,
  • Does Not Provide Crossref DOI
  • Not indexed in Scopus, WoS, DOAJ, PubMed, UGC CARE

Indexing