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Journal Photo for Surface Topography: Metrology and Properties
Peer reviewed only Open Access

Surface Topography: Metrology and Properties (STMP)

Publisher : Institute of Physics
Materials Chemistry Surfaces Coatings and Films
e-ISSN 2051-672X
Issue Frequency Quarterly
Impact Factor 2.4
Est. Year 2013
Mobile 4401179297481
Language English
APC YES
Email stmp@ioppublishing.org

Journal Descriptions

Surface Topography: Metrology and Properties™ (STMP) publishes the latest physics, chemistry, life science, materials science and engineering research on applied, functional surfaces. STMP also publishes cross-disciplinary work on surface and interface engineering, helping researchers to share common themes on surface properties across an array of different applications. The journal looks at surfaces from the fundamental, applied and natural sciences, at any and all length scales. STMP covers the modelling, design and characterisation of modified surfaces, as well as the structure–function relationship between the surface properties and their application. It aims to present the measurement of topography of surfaces and interfaces, and to highlight the connection between this and their resultant properties.

Surface Topography: Metrology and Properties (STMP) is :-

  • International, Peer-Reviewed, Open Access, Refereed, Materials Chemistry, Surfaces, Coatings and Films, Process Chemistry and Technology, Instrumentation, Multiscale metrology of surfaces and interfaces, Non-physical properties of surfaces and interfaces , Online , Quarterly Journal

  • UGC Approved, ISSN Approved: P-ISSN E-ISSN: 2051-672X, Established: 2013, Impact Factor: 2.4
  • Does Not Provide Crossref DOI
  • Not indexed in Scopus, WoS, DOAJ, PubMed, UGC CARE

Indexing