Surface Science Spectra (SSS)

Surface Science Spectra (SSS) offers convenient and easy access to peer-reviewed spectral data from on-going international industrial and academic research. SSS publishes reference and comparison spectral data representing a range of techniques, including XPS, AES, SE, UV-vis, LEIS, ToF-SIMS, LEIPS, and BIS and Instrument Papers. SSS features over 1600 specimens of interest with downloadable data, as well as focused topics that contribute to the completeness of the archival database by including collections of spectra on materials of particular interest to the community. SSS systematically and uniformly archives surface data from a wide range of fields, giving you usable reference spectra and the latest findings from new research and materials important to your work. SSS makes available each spectrum in its unsmoothed and unmanipulated form so that you know you are looking at original data, not someone else's interpretation. By submitting your research to this important project, you are joining a list of scientists and researchers who have contributed the important analytical reference information that surface scientists and lab analysts need. SSS is available online as well as in a yearly printed volume.

Surface Science Spectra (SSS) is :-

• International, Peer-Reviewed, Open Access, Refereed, Surfaces and Interfaces, The journal focuses on experimental surface characterization data such as X-ray photoelectron spectroscopy (XPS), Auger electron spectroscopy (AES), secondary ion mass spectrometry (SIMS), spectroscopic ellipsometry and other spectroscopic techniques useful in surface science, thin films, coatings, condensed matter physics, materials science and interfaces research , Online or Print , Yearly Journal

• UGC Approved, ISSN Approved: P-ISSN P-ISSN: 1055-5269, E-ISSN: 1520-8575, Established: 1992, Impact Factor: 1.6
• Does Not Provide Crossref DOI

• Not indexed in Scopus, WoS, DOAJ, PubMed, UGC CARE