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Quality Engineering (QE)

Publisher :

Taylor and Francis Ltd.

Scopus Profile
Peer reviewed only
Scopus Profile
Open Access
  • STATISTICS
  • Engineering
e-ISSN :

1532-4222

Issue Frequency :

Quarterly

p-ISSN :

0898-2112

Est. Year :

1970

Mobile :

18006347064

Country :

United States

Language :

English

APC :

YES

Impact Factor Assignee :

Google Scholar

Email :

orders@taylorandfrancis.com

Journal Descriptions

Quality Engineering aims to promote a rich exchange among the quality engineering community by publishing papers that describe new methods ready for immediate industrial application or novel examples of employed techniques. You are invited to submit application-motivated manuscripts describing methodological contributions and/or case studies related to: Experimental design and analysis Measurement system analysis Process modeling Product and process optimization Quality control and process monitoring Reliability Response surface methodology Risk analysis and management Robust parameter design Statistical engineering Test and evaluation techniques Uncertainty quantification for quality We also strongly encourage manuscripts on emerging areas of quality engineering. For example, manuscripts focused on techniques and tools in Quality 4.0, intelligent manufacturing, data science and analytics for quality, and network systems analysis are particularly welcome.


Quality Engineering (QE) is :

International, Peer-Reviewed, Open Access, Refereed, STATISTICS, Engineering , Online or Print, Quarterly Journal

UGC Approved, ISSN Approved: P-ISSN - 0898-2112, E-ISSN - 1532-4222, Established in - 1970, Impact Factor

Not Provide Crossref DOI

Indexed in Scopus, WoS

Not indexed in DOAJ, PubMed, UGC CARE

Indexing

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Scopus
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WoS
Scopus Profile
SJR

+6 More

Publications of QE

  • dott image June, 2021

The role of the normal distribution in statistical process monitoring

We discuss issues related to the use of the normality assumption in statistical process monitoring with continuous data. Our illustrations involve the Shewhart X-chart. We illustrate some of...

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