Microelectronics and Solid State Electronics (MSSE)

Microelectronics and Solid State Electronics aims to bridge the gap between fundamental solid state research and practical microelectronic engineering advances. The journal encompasses a wide range of subject areas including advanced MOS devices, semiconductor nanostructures, device‑level measurements and testing, nanolithography techniques, interconnect technologies, optoelectronic components, and flexible/polymer electronics. It also places emphasis on emerging technologies that impact electronic systems, such as advanced fabrication techniques, electron beam processing, and integration methods for high‑performance circuits and systems. With its international authorship and readership, the journal seeks to promote cross‑disciplinary collaboration between physicists, materials scientists, and electrical engineers. The publication encourages contributions that not only present significant experimental results but also deepen understanding of the underlying physical mechanisms that govern device behavior and system performance. As an active publication in the field, it supports the advancement of microelectronics innovation and provides researchers and practitioners with access to cutting‑edge developments in solid state and electronic device science.

Microelectronics and Solid State Electronics (MSSE) is :-

• International, Peer-Reviewed, Open Access, Refereed, Advanced MOS Devices, AFM, Scanning Probe Measurements, Electron Beam Testers, Emerging Nanopatterning Methods, Interconnects, Laser Assisted Processing, Laser Probes, Limits of Nanolithography and Nanopatterning, Maskless Lithography, Mesoscopic Devices, Nanometer Devices for Electronics and Optoelectronics, New Resist Materials, Optical Lithography, Organic and Molecular Electronics, Polymers and Flexible Substrates , Online or Print , Bi-Monthly Journal

• UGC Approved, ISSN Approved: P-ISSN P-ISSN: 2324-643X, E-ISSN: 2324-6456, Established: 2012,
• Does Not Provide Crossref DOI

• Not indexed in Scopus, WoS, DOAJ, PubMed, UGC CARE