IEEE Design & Test (IDT)

IEEE Design & Test offers original works describing the models, methods and tools used to design and test microelectronic systems from devices and circuits to complete systems-on-chip and embedded software. The magazine focuses on current and near-future practice, and includes tutorials, how-to articles, and real-world case studies. The magazine seeks to bring to its readers not only important technology advances but also technology leaders, their perspectives through its columns, interviews and roundtable discussions. Topics include semiconductor IC design, semiconductor intellectual property blocks, design, verification and test technology, design for manufacturing and yield, embedded software and systems, low-power and energy efficient design, electronic design automation tools, practical technology, and standards.Policies that apply to all IEEE publications, including policies related to the use of AI, can be found in the Publications Services and Products Operations Manual. This publication considers original works that enhance the existing body of knowledge. Original review articles and surveys are acceptable, even if new data/concepts are not presented. Results described in the article should not have been submitted or published elsewhere. Expanded versions of conference publications may be submitted. Articles must be intelligible and must be written in standard English.

IEEE Design & Test (IDT) is :-

• International, Peer-Reviewed, Open Access, Refereed, Software, Electrical and Electronic Engineering, Hardware and Architecture, semiconductor IC design, semiconductor intellectual property blocks, design, verification and test technology, design for manufacturing and yield, embedded software and systems, low-power and energy efficient design, electronic design automation tools, practical technology, standards , Online or Print , Bi-Monthly Journal

• UGC Approved, ISSN Approved: P-ISSN P-ISSN: 2168-2356, E-ISSN: 2168-2364, Established: 1984, Impact Factor: 1.9
• Does Not Provide Crossref DOI

• Not indexed in Scopus, WoS, DOAJ, PubMed, UGC CARE